Depth profiling study of in situ CdCl2 treated CdTe/CdS heterostructure with glancing angle incidence X-ray diffraction-Reference-Cited by-同舟云学术

Depth profiling study of in situ CdCl2 treated CdTe/CdS heterostructure with glancing angle incidence X-ray diffraction

Published:2004-03 Issue:2 Volume:450 Page:255-260
ISSN:0040-6090
Container-title:Thin Solid Films
language:en
Short-container-title:Thin Solid Films

Author:

Vamsi Krishna K,Dutta V

Publisher

Elsevier BV

Subject

Materials Chemistry,Metals and Alloys,Surfaces, Coatings and Films,Surfaces and Interfaces,Electronic, Optical and Magnetic Materials

Reference28 articles.

1. Thin‐film CdS/CdTe solar cell with 15.8% efficiency

2. H.R. Moutinho, M.M. Al-Jassim, F.A. Abufoltuh, D.H. Levi, P.C. Dippo, R.G. Dhere, L.L. Kazmerski, Proceedings of the 26th IEEE Photovoltaic Specialists Conference, Anaheim, USA, 1997, p. 431

3. Intermixing at the CdS/CdTe Interface and its Effect on Device Performance

4. Recrystallization and sulfur diffusion in CdCl2-treated CdTe/CdS thin films

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