Structural studies on Si:H network by Raman, micro-photoluminescence, electron microscopy and ultraviolet ellipsometry: effect of Ar dilution to the SiH4-plasma-Reference-Cited by-同舟云学术

Structural studies on Si:H network by Raman, micro-photoluminescence, electron microscopy and ultraviolet ellipsometry: effect of Ar dilution to the SiH4-plasma

Published:2005-04 Issue:2 Volume:476 Page:237-245
ISSN:0040-6090
Container-title:Thin Solid Films
language:en
Short-container-title:Thin Solid Films

Author:

Das Debajyoti

Publisher

Elsevier BV

Subject

Materials Chemistry,Metals and Alloys,Surfaces, Coatings and Films,Surfaces and Interfaces,Electronic, Optical and Magnetic Materials

Reference45 articles.

1. Microcrystalline Si: H Film and Its Application to Solar Cells

2. Deposition of phosphorus doped microcrystalline silicon below 70 °C at 70 MHz

3. On the Way Towards High Efficiency Thin Film Silicon Solar Cells by the “Micromorph” Concept

4. Solid State Phenomena;Das,1995

5. Control of hydrogenation and modulation of the structural network in Si:H by interrupted growth and H-plasma treatment

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