On the processing–structure–property relationship of ITO layers deposited on crystalline and amorphous Si-Reference-Cited by-同舟云学术

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On the processing–structure–property relationship of ITO layers deposited on crystalline and amorphous Si

Published:2007-10 Issue:24 Volume:515 Page:8539-8543
ISSN:0040-6090
Container-title:Thin Solid Films
language:en
Short-container-title:Thin Solid Films

Author:

Diplas S.,Ulyashin A.,Maknys K.,Gunnaes A.E.,Jørgensen S.,Wright D.,Watts J.F.,Olsen A.,Finstad T.G.

Publisher

Elsevier BV

Subject

Materials Chemistry,Metals and Alloys,Surfaces, Coatings and Films,Surfaces and Interfaces,Electronic, Optical and Magnetic Materials

Reference12 articles.

1. Thin-film solar cells: an overview

2. Degradation of tin‐doped indium‐oxide film in hydrogen and argon plasma

3. Nucleation and growth of thin films

4. Analysis of ITO thin layers and interfaces in heterojunction solar cells structures by AFM, SCM and SSRM methods

Cited by 21 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Performance improvement of planar silicon heterojunction solar cells via sandwich-like p-type emitters;Applied Physics A;2021-09-04

2. Advanced Characterizations of Oxides for Optoelectronic Applications;Oxide Electronics;2021-04-30

3. Mechanism of indium tin oxide//indium tin oxide direct wafer bonding;Thin Solid Films;2020-06

4. Enhanced transmittance of ITO/Ag(Cr)/ITO (IAI) multi-layered thin films by high temperature annealing;Materials Letters;2015-04

5. Plasma treatment of ITO films for the formation of nanoparticles toward scalable production of novel nanostructure-based solar cells;physica status solidi (a);2014-09-23

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