Influence of substrate absorption on accuracy of determination of refractive index and thickness of uniform thin chalcogenide Cu1[As2(S0.5Se0.5)3]99 film-Reference-Cited by-同舟云学术

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Influence of substrate absorption on accuracy of determination of refractive index and thickness of uniform thin chalcogenide Cu1[As2(S0.5Se0.5)3]99 film

Published:2010-08 Issue:20 Volume:518 Page:5679-5682
ISSN:0040-6090
Container-title:Thin Solid Films
language:en
Short-container-title:Thin Solid Films

Author:

Štrbac D.D.,Lukić S.R.,Petrović D.M.,Gonzalez-Leal J.M.,Srinivasan A.,Štrbac G.R.

Publisher

Elsevier BV

Subject

Materials Chemistry,Metals and Alloys,Surfaces, Coatings and Films,Surfaces and Interfaces,Electronic, Optical and Magnetic Materials

Reference12 articles.

1. Films of chalcogenide glassy semiconductors: new phenomena and new applications

2. A simple method for the determination of the optical constants n, k and the thickness of a weakly absorbing thin film

3. On the photo- and thermally-induced darkening phenomena in As40S40Se20amorphous chalcogenide thin films

Cited by 1 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Influence of copper on hardness of amorphous As–Se–I thin films;Materials Science and Technology;2013-12-06

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