Rotating polarizer-analyzer scanning ellipsometer-Reference-Cited by-同舟云学术

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Rotating polarizer-analyzer scanning ellipsometer

Published:2010-07 Issue:19 Volume:518 Page:5610-5614
ISSN:0040-6090
Container-title:Thin Solid Films
language:en
Short-container-title:Thin Solid Films

Author:

El-Agez Taher M.,El Tayyan Ahmed A.,Taya Sofyan A.

Publisher

Elsevier BV

Subject

Materials Chemistry,Metals and Alloys,Surfaces, Coatings and Films,Surfaces and Interfaces,Electronic, Optical and Magnetic Materials

Reference14 articles.

1. Ellipsometry and Polarized Light;Azzam,1977

2. Spectroscopic Ellipsometry and Reflectometry: A User's Guide;Tompkins,1999

3. Handbook of Ellipsometry;Tompkins,2005

4. Infrared Ellipsometry on Semiconductor Layer Structures: Phonons, Plasmons, and Polaritons;Schubert,2004

5. Spectroscopic Ellipsometry Principles and Applications;Fujiwara,2007

Cited by 22 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. A Comprehensive Review on Combinatorial Film via High-Throughput Techniques;Materials;2023-10-15

2. Calibration of residual polarization in light source for broadband rotating polarizer spectroscopic ellipsometer;Thin Solid Films;2023-03

3. Tailoring of optical and wetting properties of electron beam deposited Ag nanostructure films by oblique angle deposition;Journal of Optics;2022-10-01

4. Error Analysis for Repeatability Enhancement of a Dual-Rotation Mueller Matrix Ellipsometer;Frontiers in Physics;2022-01-12

5. Method for Analyzing the Measurement Error with Respect to Azimuth and Incident Angle for the Rotating Polarizer Analyzer Ellipsometer;Crystals;2021-03-29

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