Spectroscopic ellipsometry characterization of amorphous carbon and amorphous, graphitic and fullerene-like carbon nitride thin films-Reference-Cited by-同舟云学术

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Spectroscopic ellipsometry characterization of amorphous carbon and amorphous, graphitic and fullerene-like carbon nitride thin films

Published:2009-10 Issue:24 Volume:517 Page:6652-6658
ISSN:0040-6090
Container-title:Thin Solid Films
language:en
Short-container-title:Thin Solid Films

Author:

Berlind T.,Furlan A.,Czigany Zs.,Neidhardt J.,Hultman L.,Arwin H.

Publisher

Elsevier BV

Subject

Materials Chemistry,Metals and Alloys,Surfaces, Coatings and Films,Surfaces and Interfaces,Electronic, Optical and Magnetic Materials

Reference41 articles.

1. Prediction of New Low Compressibility Solids

2. Mechanical and tribological properties of CNx films deposited by reactive pulsed laser ablation

3. A study of ultra-thin film ion beam deposited (IBD) hydrogenated amorphous carbon (a-C:H) using atomic force microscopy (AFM) and transmission electron microscopy (TEM)

4. Proceedings of the 30th International Spring Seminar on Electronics Technology, Cluj-Napoca, Romania, May 9–13;Heimann,2007

Cited by 7 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Micro-tribological performance of fullerene-like carbon and carbon-nitride surfaces;Tribology International;2018-12

2. Spectroscopic ellipsometry characterization of Ge30-xSbx Se70 films using combinations of multiple dispersion functions;Optik;2017-10

3. Structure evolution of hydrogenated carbon films from amorphous carbon to fullerene-like nanostructure;Surface and Interface Analysis;2014-05-15

4. Influence of deposition pressure on hydrogenated amorphous carbon films prepared by d.c.-pulse plasma chemical vapor deposition;Surface and Interface Analysis;2012-09-04

5. Seeing Double: Coupling between Substrate Image Charges and Collective Plasmon Modes in Self-Assembled Nanoparticle Superstructures;ACS Nano;2011-05-18

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