Approximations of reflection and transmission coefficients of inhomogeneous thin films based on multiple-beam interference model
Author:
Funder
Ministerstvo Školství, Mládeže a Tělovýchovy
Publisher
Elsevier BV
Subject
Materials Chemistry,Metals and Alloys,Surfaces, Coatings and Films,Surfaces and Interfaces,Electronic, Optical and Magnetic Materials
Reference49 articles.
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3. Ellipsometric method for the determination of all the optical parameters of the system of an isotropic nonabsorbing film on an isotropic absorbing substrate. Optical constants of silicon;Vedam;J. Opt. Soc. Am.,1969
4. Influence of absorption on measurement of refractive index of films;Heavens;Appl. Opt.,1965
5. Simple method for the complete optical analysis of very thick and weakly absorbing films - Application to magnetic garnet films;Ohlídal;Appl. Phys. A,1982
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