Interface properties of a-Si:H/c-Si heterojunction solar cells from admittance spectroscopy-Reference-Cited by-同舟云学术

登录注册会员服务联系我们

Interface properties of a-Si:H/c-Si heterojunction solar cells from admittance spectroscopy

Published:2006-07 Issue: Volume:511-512 Page:385-389
ISSN:0040-6090
Container-title:Thin Solid Films
language:en
Short-container-title:Thin Solid Films

Author:

Gudovskikh A.S.,Kleider J.-P.,Damon-Lacoste J.,Roca i Cabarrocas P.,Veschetti Y.,Muller J.-C.,Ribeyron P.-J.,Rolland E.

Publisher

Elsevier BV

Subject

Materials Chemistry,Metals and Alloys,Surfaces, Coatings and Films,Surfaces and Interfaces,Electronic, Optical and Magnetic Materials

Reference12 articles.

1. Proceedings of the 3rd World Conference on Photovoltaic Energy Conversion, Osaka, Japan May;Tanaka,2003

2. Measurement of the density of gap states in hydrogenated amorphous silicon by space charge spectroscopy

3. Admittance spectroscopy of impurity levels in Schottky barriers

4. Defects and transport in a-Si:H/c-Si heterojunctions

5. Investigation of a-Si:H/c-Si heterojunction solar cells interface properties

Cited by 46 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Morphological, Optical, and Electrical Properties of a MOS Capacitor Based on Rare Earth Oxide and p-Porous GaAs;Journal of Electronic Materials;2024-07-22

2. PyDCM: Custom Data Center Models with Reinforcement Learning for Sustainability;Proceedings of the 10th ACM International Conference on Systems for Energy-Efficient Buildings, Cities, and Transportation;2023-11-15

3. Investigation of anisotropic textured crystalline silicon surface passivation with intrinsic amorphous silicon layers: role of annealing pressure conditions during passivation recovery;Journal of Materials Science: Materials in Electronics;2023-07

4. Characterization of the defect in CIGSe solar cell by admittance spectroscopy;AIP Advances;2023-02-01

5. Characterization of defects in CIGSe solar cells through admittance spectroscopy;Acta Physica Sinica;2023

同舟云学术

1.学者识别学者识别

2.学术分析学术分析

3.人才评估人才评估

"同舟云学术"是以全球学者为主线，采集、加工和组织学术论文而形成的新型学术文献查询和分析系统，可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容，当前同舟云学术共收录了国内外主流学术期刊6万余种，收集的期刊论文及会议论文总量共计约1.5亿篇，并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询！咨询电话：010-8811{复制后删除}0370

www.globalauthorid.com

TOP

Copyright © 2019-2024 北京同舟云网络信息技术有限公司
京公网安备11010802033243号京ICP备18003416号-3