High-resolution X-ray photoelectron spectroscopy study of InTe thin film in structural phase transition from amorphous to crystalline phase-Reference-Cited by-同舟云学术

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High-resolution X-ray photoelectron spectroscopy study of InTe thin film in structural phase transition from amorphous to crystalline phase

Published:2010-05 Issue:15 Volume:518 Page:4442-4445
ISSN:0040-6090
Container-title:Thin Solid Films
language:en
Short-container-title:Thin Solid Films

Author:

Lee Young Mi,Park Yongsup,Sun Chang-Woo,Lee Jeong Yong,Shin Hyun Joon,Kim Yong Tae,Jung Min-Cherl

Publisher

Elsevier BV

Subject

Materials Chemistry,Metals and Alloys,Surfaces, Coatings and Films,Surfaces and Interfaces,Electronic, Optical and Magnetic Materials

Reference15 articles.

1. Rapid‐phase transitions of GeTe‐Sb2Te3pseudobinary amorphous thin films for an optical disk memory

2. Understanding the phase-change mechanism of rewritable optical media

3. Investigation of electronic structure of amorphous, metastable, and stable phases of Ge1Sb2Te4 film by high-resolution x-ray photoemission spectroscopy

4. Symposium on VLSI Technology;Ahn,2005

Cited by 3 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Synthesis of single-phase stoichiometric InTe thin films for opto-electronic applications;Superlattices and Microstructures;2019-05

2. Two different phase-change origins with chemical- and structural-phase-changes in C doped (1.5 wt.%) In3Sb1Te2;Scientific Reports;2016-12

3. High-Resolution X-Ray Photoelectron Spectroscopy Study of a Sb2Te3Thin Film with the Polycrystalline Phase;Journal of the Korean Vacuum Society;2012-11-30

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