Multilayer model for determining the thickness and refractive index of sol–gel coatings via laser ellipsometry-Reference-Cited by-同舟云学术

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Multilayer model for determining the thickness and refractive index of sol–gel coatings via laser ellipsometry

Published:2013-03 Issue: Volume:531 Page:93-98
ISSN:0040-6090
Container-title:Thin Solid Films
language:en
Short-container-title:Thin Solid Films

Author:

Loke Vincent L.Y.,Riefler Norbert,Mehner Andreas,Prenzel Torsten,Hoja Timo,Wriedt Thomas,Mädler Lutz

Funder

German Research Foundation (DFG)

Publisher

Elsevier BV

Subject

Materials Chemistry,Metals and Alloys,Surfaces, Coatings and Films,Surfaces and Interfaces,Electronic, Optical and Magnetic Materials

Reference31 articles.

1. XXXV.—On the properties of silicic acid and other analogous colloidal substances

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2. Same Precursor, Two Different Products: Comparing the Structural Evolution of In–Ga–O “Gel-Derived” Powders and Solution-Cast Films Using Pair Distribution Function Analysis;Journal of the American Chemical Society;2017-04-03

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