Author:
Fricke Lennart,Böntgen Tammo,Lorbeer Jan,Bundesmann Carsten,Schmidt-Grund Rüdiger,Grundmann Marius
Subject
Materials Chemistry,Metals and Alloys,Surfaces, Coatings and Films,Surfaces and Interfaces,Electronic, Optical and Magnetic Materials
Reference7 articles.
1. Spectroscopic Ellipsometry: Principles and Applications;Fujiwara,2007
2. Generalized ellipsometry and complex optical systems
3. Systematic errors in rotating-compensator ellipsometry
4. B. D. Johs, C. M. Herzinger, US Patent 5872630, 2000.
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