Martens hardness of Constantan thin films on (100) Si wafer: Improvement in contact area function in nanoindentation-Reference-Cited by-同舟云学术

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Martens hardness of Constantan thin films on (100) Si wafer: Improvement in contact area function in nanoindentation

Published:2023-03 Issue: Volume:768 Page:139712
ISSN:0040-6090
Container-title:Thin Solid Films
language:en
Short-container-title:Thin Solid Films

Author:

Dziri Ayyoub,Montagne Alex,Roudet Francine^ORCID,Ziouche Katir,Chicot Didier^ORCID

Publisher

Elsevier BV

Subject

Materials Chemistry,Metals and Alloys,Surfaces, Coatings and Films,Surfaces and Interfaces,Electronic, Optical and Magnetic Materials

Reference27 articles.

1. An explanation of the indentation size effect in ceramics;Bull;Philos. Mag. Lett.,1989

2. Real-time quantitative analysis of volatile products generated during solid-state polypropylene thermal oxidation;François-Heude;Polym. Test,2013

3. Analysis of indentation size effect in copper and its alloys;Chicot;Mater. Sci. Technol.,2013

4. An improved technique for determining hardness and elastic modulus using load and displacement;Oliver;J. Mater. Res.,1992

5. « Self-calibration in compliance and indenter tip defect for instrumented indentation;Chicot;J. Mater. Res.,2022

Cited by 1 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Improvement in Calibration Procedure in Nanoindentation: An Indenter Bluntness Indicator;Experimental Mechanics;2024-03-01

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