Author:
Krämer Markus,Roodenko Katy,Pollakowski Beatrix,Hinrichs Karsten,Rappich Jörg,Esser Norbert,von Bohlen Alex,Hergenröder Roland
Subject
Materials Chemistry,Metals and Alloys,Surfaces, Coatings and Films,Surfaces and Interfaces,Electronic, Optical and Magnetic Materials
Reference51 articles.
1. Handbook of Ellipsometry,2005
2. Spectroscopic Ellipsometry, Principles and Applications;Fujiwara,2007
3. X-Ray Scattering from Soft Matter Thin Films-Materials Science and Basic Research;Tolan,1999
4. Interfacial electron density profile in Nb/Si bilayer films: an X-ray reflectivity study
5. Determination of microscopic interaction constants by X-ray reflectivity measurements
Cited by
5 articles.
订阅此论文施引文献
订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献