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Preferential orientation in bismuth thin films as a function of growth conditions

  • Published:2017-08 Issue: Volume:636 Page:384-391
  • ISSN:0040-6090
  • Container-title:Thin Solid Films
  • language:en
  • Short-container-title:Thin Solid Films

Author:

Rodil S.E.ORCID,Garcia-Zarco O.,Camps E.,Estrada H.,Lejeune M.,Bourja L.,Zeinert A.

Funder

European Union FP7-NMP EU-Mexico programme

CONACYT

Publisher

Elsevier BV

Subject

Materials Chemistry,Metals and Alloys,Surfaces, Coatings and Films,Surfaces and Interfaces,Electronic, Optical and Magnetic Materials

Reference68 articles.

1. Structure determined electrical transport properties of bismuth thin films;Neuman;J. Vac. Sci. Technol.,1966

2. Electrical conductivity and halls effect of bismuth thin films between 4.2 degrees Kelvin and 300 degrees Kelvin;Letraon;J. Phys. Paris,1969

3. Measuring photoelectromagnetic effect in bismuth thin films;Monsion;C.R. Acad. Sci. B Phys.,1969

4. Magnetoresistance of Bismuth Thin Films in a Parallel Magnetic Field;Andrievs;Sov. Phys. Solid State,1970

5. Quantum size effects in polycrystalline bismuth thin films;Miller;Am. J. Phys.,1971
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