Measuring film thickness using infrared imaging-Reference-Cited by-同舟云学术

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Measuring film thickness using infrared imaging

Published:2005-02 Issue:2 Volume:473 Page:196-200
ISSN:0040-6090
Container-title:Thin Solid Films
language:en
Short-container-title:Thin Solid Films

Author:

Decker Carrie A.,Mackin Thomas J.

Publisher

Elsevier BV

Subject

Materials Chemistry,Metals and Alloys,Surfaces, Coatings and Films,Surfaces and Interfaces,Electronic, Optical and Magnetic Materials

Reference18 articles.

1. Handbook of Thin Film Devices,2000

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