X-ray photoelectron spectroscopy studies on single crystalline β-FeSi2-Reference-Cited by-同舟云学术

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X-ray photoelectron spectroscopy studies on single crystalline β-FeSi2

Published:2016-05 Issue: Volume:606 Page:1-6
ISSN:0040-6090
Container-title:Thin Solid Films
language:en
Short-container-title:Thin Solid Films

Author:

Mao Wei,Udono Haruhiko,Yamaguchi Kenji,Terai Takayuki,Matsuzaki Hiroyuki

Funder

Ministry of Education, Culture, Sports, Science and Technology

Publisher

Elsevier BV

Subject

Materials Chemistry,Metals and Alloys,Surfaces, Coatings and Films,Surfaces and Interfaces,Electronic, Optical and Magnetic Materials

Reference16 articles.

1. Room temperature 1.6μm electroluminescence from a Si-based light emitting diode with β-FeSi2 active region;Suemasu;Jpn. J. Appl. Phys.,2000

2. Room-temperature 1.56μm electroluminescence of highly oriented β-FeSi2/Si single heterojunction prepared by magnetron-sputtering deposition;Chu;Jpn. J. Appl. Phys.,2002

3. Thermal expansion of β-FeSi2 at low temperatures;Terai;Thin Solid Films,2004

4. Dependence of lattice parameter of melt-grown ZnSe on Zn partial pressure during in-situ annealing;Udono;Jpn. J. Appl. Phys.,1999

5. β-FeSi2 single crystals grown from solution;Udono;Jpn. J. Appl. Phys.,2001

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