A challenge for x-ray photoelectron spectroscopy characterization of Cu(In,Ga)Se2 absorbers: The accurate quantification of Ga/(Ga + In) ratio
Author:
Publisher
Elsevier BV
Subject
Materials Chemistry,Metals and Alloys,Surfaces, Coatings and Films,Surfaces and Interfaces,Electronic, Optical and Magnetic Materials
Reference20 articles.
1. Chemical engineering of Cu(In,Ga)Se2 surfaces: an absolute deoxidation studied by x-ray photoelectron spectroscopy (XPS) and auger electron spectroscopy (X-AES) signatures;Loubat;Thin Solid Films,2016
2. Optical constants of Cu (ln, Ga) Se2 thin films from normal incidence transmittance and reflectance;Orgassa,2003
3. Dielectric function of Cu(In,Ga)Se2-based polycrystalline materials;Minoura;J. Appl. Phys.,2013
4. Optical constants of Cu(In, Ga)Se2 for arbitrary Cu and Ga compositions;Minoura;J. Appl. Phys.,2015
5. Optical constants of Cu(In1−xGax)5Se8 crystals;Levcenko;J. Appl. Phys.,2010
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