Suppression of crystallization process in Atomic Layer Deposited hafnium oxide films

Author:

Li Yanrui,Deng Songwen,Li Gang,Li Juntao,Lv Qipeng,Jin Yuqi

Funder

National Key Research and Development Program of China

Publisher

Elsevier BV

Reference28 articles.

1. Development of hafnium based high-k materials—A review;Choi;Mater. Sci. Eng.: R: Reports,2011

2. Enhanced ferroelectricity in ultrathin films grown directly on silicon;Cheema Suraj;Nature,2020

3. Negres Raluca A. Ten-year summary of the Boulder Damage Symposium annual thin film laser damage competition;Stolz Christopher;Opt. Eng.,2018

4. Ultrathin HfO2 films grown on silicon by atomic layer deposition for advanced gate dielectrics applications;Gusev;Microelectron. Eng.,2003

5. Antireflection coating with consistent near-neutral color on complex-shaped substrates prepared by ALD;Kristin;Opt. Lett.,2019

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