Tracking optical properties of VO films to optimize polycrystalline VO2 fabrication

Author:

Jayswal Niva K.ORCID,Subedi IndraORCID,Shan AmbalanathORCID,Podraza Nikolas J.

Publisher

Elsevier BV

Reference58 articles.

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2. Analyzing optical properties of thin vanadium oxide films through semiconductor-to-metal phase transition using spectroscopic ellipsometry;Sun;Appl. Surf. Sci.,2017

3. Interplay between electronic and structural transitions in VO2 revealed by ellipsometry;Voloshenko;J. Vac. Sci. Technol. B, Nanotechnol. Microelectron.: Mater., Process., Meas., Phenomena,2019

4. Temperature dependence of the optical properties of VO2 deposited on sapphire with different orientations;Nazari;Phys. Rev. B,2013

5. Nano-optical investigations of the metal−insulator phase behavior of individual VO2 microcrystals;Jones;Nano Lett.,2010

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