Nanoscale study by piezoresponse force microscopy of relaxor 0.7Pb(Mg1/3Nb2/3)O3–0.3PbTiO3 and 0.9Pb(Mg1/3Nb2/3)O3–0.1PbTiO3 thin films grown on platinum and LaNiO3 electrodes-Reference-Cited by-同舟云学术

Nanoscale study by piezoresponse force microscopy of relaxor 0.7Pb(Mg1/3Nb2/3)O3–0.3PbTiO3 and 0.9Pb(Mg1/3Nb2/3)O3–0.1PbTiO3 thin films grown on platinum and LaNiO3 electrodes

Published:2010-06 Issue:16 Volume:518 Page:4670-4674
ISSN:0040-6090
Container-title:Thin Solid Films
language:en
Short-container-title:Thin Solid Films

Author:

Detalle M.,Ferri A.,Da Costa A.,Desfeux R.,Soyer C.,Rémiens D.

Publisher

Elsevier BV

Subject

Materials Chemistry,Metals and Alloys,Surfaces, Coatings and Films,Surfaces and Interfaces,Electronic, Optical and Magnetic Materials

Reference30 articles.

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4. Ferroelectric thin films VII, Proceedings of the Symposium, Boston, MA; United States;Fukumaru,1999

5. Electrostrictive effect in Pb(Mg1/3Nb2/3)O3-type materials

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