Spectroellipsometric and ion beam analytical investigation of nanocrystalline diamond layers-Reference-Cited by-同舟云学术

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Spectroellipsometric and ion beam analytical investigation of nanocrystalline diamond layers

Published:2011-02 Issue:9 Volume:519 Page:2806-2810
ISSN:0040-6090
Container-title:Thin Solid Films
language:en
Short-container-title:Thin Solid Films

Author:

Lohner T.,Csíkvári P.,Khánh N.Q.,Dávid S.,Horváth Z.E.,Petrik P.,Hárs G.

Funder

Hungarian Scientific Research Fund

Publisher

Elsevier BV

Subject

Materials Chemistry,Metals and Alloys,Surfaces, Coatings and Films,Surfaces and Interfaces,Electronic, Optical and Magnetic Materials

Reference31 articles.

1. Spectroellipsometry characterization of optical quality vapor‐deposited diamond thin films

2. Real time spectroscopic ellipsometry characterization of the nucleation of diamond by filament‐assisted chemical vapor deposition

3. Characterization of nucleation and growth of MW-CVD diamond films by spectroscopic ellipsometry and ion beam analysis methods

4. Application of real-time spectroscopic ellipsometry for the development of low-temperature diamond film growth processes

5. Ex situ spectroscopic ellipsometry investigation of the layered structure of polycrystalline diamond thin films grown by electron cyclotron resonance-assisted chemical vapor deposition

Cited by 6 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Spectroscopic Ellipsometry of Nanocrystalline Diamond Film Growth;ACS Omega;2017-10-16

2. Nanocrystalline Diamond Coatings;Encyclopedia of Plasma Technology;2016-12-12

3. Spectroscopic ellipsometry characterization of nano-crystalline diamond films prepared at various substrate temperatures and pulsed plasma frequencies using microwave plasma enhanced chemical vapor deposition apparatus with linear antenna delivery;Thin Solid Films;2014-11

4. Spectroellipsometric characterization of nanocrystalline diamond layers;Applied Surface Science;2013-09

5. Ellipsometry of Semiconductor Nanocrystals;Ellipsometry at the Nanoscale;2013

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