Electronic structure of carbon nitride thin films studied by X-ray spectroscopy techniques-Reference-Cited by-同舟云学术

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Electronic structure of carbon nitride thin films studied by X-ray spectroscopy techniques

Published:2005-01 Issue:1-2 Volume:471 Page:19-34
ISSN:0040-6090
Container-title:Thin Solid Films
language:en
Short-container-title:Thin Solid Films

Author:

Hellgren Niklas,Guo Jinghua,Luo Yi,Såthe Conny,Agui Akane,Kashtanov Stepan,Nordgren Joseph,Ågren Hans,Sundgren Jan-Eric

Publisher

Elsevier BV

Subject

Materials Chemistry,Metals and Alloys,Surfaces, Coatings and Films,Surfaces and Interfaces,Electronic, Optical and Magnetic Materials

Reference70 articles.

1. A review of the preparation of carbon nitride films

2. Superhard and Elastic Carbon Nitride Thin Films Having Fullerenelike Microstructure

3. Mechanical and tribological properties of CNx films deposited by reactive magnetron sputtering

4. Ultra-Thin Overcoats for the Head/Disk Interface Tribology

5. Field Emission from Tetrahedrally Bonded Amorphous Carbon

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