Cu K-edge X-ray fine structure changes in CdTe with CdCl2 processing-Reference-Cited by-同舟云学术

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Cu K-edge X-ray fine structure changes in CdTe with CdCl2 processing

Published:2005-06 Issue: Volume:480-481 Page:95-98
ISSN:0040-6090
Container-title:Thin Solid Films
language:en
Short-container-title:Thin Solid Films

Author:

Liu Xiangxin,Compaan A.D.,Terry Jeff

Publisher

Elsevier BV

Subject

Materials Chemistry,Metals and Alloys,Surfaces, Coatings and Films,Surfaces and Interfaces,Electronic, Optical and Magnetic Materials

Reference15 articles.

1. 29th IEEE Photovoltaic Spec. Conf.;Pudov,2002

2. X-ray Absorption: Principles, Applications, Techniques of EXAFS, SEXAFS and XANES;Koningsberger,1988

3. Study of Non-Aqueous Passivation on GaSb (100) Surfaces

4. P.V. Meyers, C.H. Liu, T.J. Frey, U.S. Patent 4,710,589 (1987).

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3. Growth and characterization of CuCdTeO thin films sputtered from CdTe–CuO composite targets;Vacuum;2014-03

4. Physics and chemistry of CdTe/CdS thin film heterojunction photovoltaic devices: fundamental and critical aspects;Energy Environ. Sci.;2014

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