Interface analysis of Mg/Sc and Sc/Mg bilayers using X-ray reflectivity
Author:
Publisher
Elsevier BV
Subject
Materials Chemistry,Metals and Alloys,Surfaces, Coatings and Films,Surfaces and Interfaces,Electronic, Optical and Magnetic Materials
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3. Structural and Band Gap Investigation of GaN:ZnO Heterojunction Solid Solution Photocatalyst Probed by Soft X-ray Spectroscopy;McDermott;J. Phys. Chem. C.,2012
4. Electronic structure and charge carriers in metallic DNA investigated by soft x-ray spectroscopy;MacNaughton;Phys. Rev. B.,2006
5. Characterization of Sc/Mg multilayers with and without Co barriers layers for x-ray spectroscopy in the water window range;Jonnard;J. Appl. Phys.,2019
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