Topography description of thin films by optical Fourier Transform
Author:
Publisher
Elsevier BV
Subject
Materials Chemistry,Metals and Alloys,Surfaces, Coatings and Films,Surfaces and Interfaces,Electronic, Optical and Magnetic Materials
Reference10 articles.
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4. Surface roughness characterisation of a thin transparent dielectric-silver tandem by spectroscopic light scattering
5. The scattering of electromagnetic waves from rough surfaces;Beckmann,1963
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