A convenient method for determining the rotational relationship between the electron image and the diffraction pattern-Reference-Cited by-同舟云学术

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A convenient method for determining the rotational relationship between the electron image and the diffraction pattern

Published:1970-06 Issue:2 Volume:3 Page:225-228
ISSN:0026-0800
Container-title:Metallography
language:en
Short-container-title:Metallography

Author:

Moreen H.A.,Larson J.M.,Polonis D.H.,Taggart R.

Publisher

Elsevier BV

Subject

General Engineering

Reference3 articles.

1. Electron Microscopy of Thin Crystals;Hirsch,1965

2. Calibration of magnification, camera constant and image rotations for a Jem 7 electron microscope

3. Introduction of Fourier Optics;Goodman,1968

Cited by 1 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Determining rotation relationships of image and electron diffraction patterns;Metallography;1971-06

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