Investigations of trace analysis of AIIIBV semiconductor microsamples by atomic spectroscopy—VII Investigation of trace and thin-layer analysis of doping elements (Ag, Au, Bi, Cd, Sn, Tl) in InAs by atomic-absorption with electrothermal evaporation-Reference-Cited by-同舟云学术

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Investigations of trace analysis of AIIIBV semiconductor microsamples by atomic spectroscopy—VII Investigation of trace and thin-layer analysis of doping elements (Ag, Au, Bi, Cd, Sn, Tl) in InAs by atomic-absorption with electrothermal evaporation

Published:1985-03 Issue:3 Volume:32 Page:195-201
ISSN:0039-9140
Container-title:Talanta
language:
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Author:

Dittrich K

Publisher

Elsevier BV

Subject

Analytical Chemistry

Cited by 6 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Determination of cadmium in indium phosphide by electrothermal atomic absorption spectrometry and ion-selective electrode potentiometry;Fresenius' Journal of Analytical Chemistry;1997-12-01

2. Chapter 11 Inorganic industrial materials;Spectrochemical Trace Analysis for Metals and Metalloids;1996

3. Determination of thallium in telluride thermoelectric material by chemical modification and electrothermal atomic absorption spectrometry;J. Anal. At. Spectrom.;1995

4. Determination of tin in indium phosphide by electrothermal atomic absorption spectrometry and inductively coupled plasma mass spectrometry;Journal of Analytical Atomic Spectrometry;1993

5. Interference caused by indium in the atomization of Ag, Bi, Cd, Sn, and Tl in ETA—AAS;Talanta;1989-06

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