Determination of the rare-earth elements in geological materials by thin-film X-ray fluorescence and inductively-coupled plasma atomic-emission spectrometry-Reference-Cited by-同舟云学术

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Determination of the rare-earth elements in geological materials by thin-film X-ray fluorescence and inductively-coupled plasma atomic-emission spectrometry

Published:1985-06 Issue:6 Volume:32 Page:495-499
ISSN:0039-9140
Container-title:Talanta
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Author:

Qing-lie H

Publisher

Elsevier BV

Subject

Analytical Chemistry

Cited by 24 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Appraising the Spectral Interference of Dysprosium on 27 Analytes Using Capacitively Coupled Device Detector-based Inductively Coupled Plasma Atomic Emission Spectrometry Without Physical/Chemical Separation;Atomic Spectroscopy;2016-04-25

2. Spectrometric Determination of Lanthanides Series;Lanthanides Series Determination by Various Analytical Methods;2016

3. Determination of rare-earth elements in nitric acid solutions with high concentrations of uranium and macrocomponents;Journal of Analytical Chemistry;2015-03-21

4. Determination of Major and Rare Earth Elements in Bastnasite Ores by ICP‐AES;Analytical Letters;2004-12-27

5. X-ray fluorescence analysis at mg l−1level with an X-ray source powered by a dry battery;J. Anal. At. Spectrom.;2004

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