Thin Films: Characterization by X Rays-Reference-Cited by-同舟云学术

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Thin Films: Characterization by X Rays

Published:2001 Issue: Volume: Page:9229-9234
ISSN:
Container-title:Encyclopedia of Materials: Science and Technology
language:
Short-container-title:

Author:

Gibson P.N.

Publisher

Elsevier

Reference18 articles.

1. X-ray photoabsorption of solids by specular reflection;Barchewitz;J. Phys. C,1978

2. The Scattering of Electromagnetic Waves from Rough Surfaces;Beckmann,1963

3. Principles of Optics;Born,1980

4. The total reflection of x-rays;Compton;Philos. Mag,1923

5. X-ray scattering studies of thin films and surfaces: thermal oxides on silicon;Cowley;J. Phys. D,1987

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