III–V Epitaxy, Monitoring and Closed-Loop Feedback Control of Spectroscopic Ellipsometry of
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Elsevier
Reference24 articles.
1. Waveform analysis with optical multichannel detectors: applications for rapid-scan spectroscopic ellipsometry;An;Rev. Sci. Instr,1991
2. Real-time composition control using spectral ellipsometry in growth of Hg1−xCdxTe by molecular beam epitaxy;Aqariden;J. Vac. Sci. Technol., B,2000
3. Application of ellipsometry to crystal growth by organometallic chemical vapor deposition;Aspnes;Appl. Phys. Lett,1990
4. Optical control of growth of AlxGa1−xAs by organometallic chemical vapor deposition;Aspnes;Appl. Phys. Lett,1990
5. Growth of AlxGa1−xAs parabolic quantum wells by real-time feedback control of composition;Aspnes;Appl. Phys. Lett,1992
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