Accumulator-based pseudo-exhaustive two-pattern generation

Author:

Voyiatzis Ioannis

Publisher

Elsevier BV

Subject

Hardware and Architecture,Software

Reference29 articles.

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2. Digital Systems Testing and Testable Design;Abramovici,1990

3. Cellular automata-based pseudorandom generators for built-in self test;Hortensius;IEEE Transactions on CAD,1989

4. A self test approach using accumulators as test pattern generators;Stroele;International Symposium on Circuits and Systems,1995

5. Fault modeling and logic simulation of CMOS and nMOS integrated circuits;Wadsack;Bell Systems Technical Journal,1978

Cited by 4 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

1. An effective two-pattern test generator for Arithmetic BIST;Computers & Electrical Engineering;2013-02

2. Parallel Pseudo-Exhaustive and Low Power Delay Testing of VLSI Systems;Lecture Notes in Electrical Engineering;2012-09-11

3. Arithmetic module-based built-in self test architecture for two-pattern testing;IET Computers & Digital Techniques;2012

4. Recursive Pseudo-Exhaustive Two-Pattern Generation;IEEE Transactions on Very Large Scale Integration (VLSI) Systems;2010-01

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