Subject
Hardware and Architecture,Software
Reference29 articles.
1. Built-In Test for VLSI: Pseudorandom Techniques;Bardell,1987
2. Digital Systems Testing and Testable Design;Abramovici,1990
3. Cellular automata-based pseudorandom generators for built-in self test;Hortensius;IEEE Transactions on CAD,1989
4. A self test approach using accumulators as test pattern generators;Stroele;International Symposium on Circuits and Systems,1995
5. Fault modeling and logic simulation of CMOS and nMOS integrated circuits;Wadsack;Bell Systems Technical Journal,1978
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