DiaSys: Improving SoC insight through on-chip diagnosis-Reference-Cited by-同舟云学术

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DiaSys: Improving SoC insight through on-chip diagnosis

Published:2017-04 Issue: Volume:75 Page:120-132
ISSN:1383-7621
Container-title:Journal of Systems Architecture
language:en
Short-container-title:Journal of Systems Architecture

Author:

Wagner Philipp^ORCID,Wild Thomas,Herkersdorf Andreas

Publisher

Elsevier BV

Subject

Hardware and Architecture,Software

Reference24 articles.

1. Debugging Systems-on-Chip: Communication-Centric and Abstraction-Based Techniques;Vermeulen,2014

2. CoreSight - ARM, (http://www.arm.com/products/system-ip/coresight-debug-trace).

3. The Nexus 5001 Forum Standard for a Global Embedded Processor Debug Interface, Version 2.0, Tech. rep. (Dec. 2003).

4. IPextreme, Infineon Multi-Core Debug Solution: Product Brochure, 2008.

5. Intel® Trace Hub Developer’s Manual, revision 1.0 Edition, 2015.

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