Gradient space analysis of surface defects using a photometric stereo derived bump map-Reference-Cited by-同舟云学术

Gradient space analysis of surface defects using a photometric stereo derived bump map

Published:1999-03 Issue:3-4 Volume:17 Page:321-332
ISSN:0262-8856
Container-title:Image and Vision Computing
language:en
Short-container-title:Image and Vision Computing

Author:

Smith M.L,Smith G,Hill T

Publisher

Elsevier BV

Subject

Computer Vision and Pattern Recognition,Signal Processing

Reference15 articles.

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5. A classification scheme for visual defects arising in semiconductor wafer inspection;Rao;Journal of Crystal Growth,1990

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