A comparison of methods to harmonize cortical thickness measurements across scanners and sites

Author:

Sun Delin,Rakesh GopalkumarORCID,Haswell Courtney C.,Logue Mark,Baird C. Lexi,O'Leary Erin N.,Cotton Andrew S.,Xie HongORCID,Tamburrino Marijo,Chen Tian,Dennis Emily L.ORCID,Jahanshad Neda,Salminen Lauren E.ORCID,Thomopoulos Sophia I.,Rashid Faisal,Ching Christopher R.K.,Koch Saskia B.J.ORCID,Frijling Jessie L.,Nawijn LauraORCID,van Zuiden Mirjam,Zhu Xi,Suarez-Jimenez BenjaminORCID,Sierk Anika,Walter HenrikORCID,Manthey Antje,Stevens Jennifer S.,Fani NegarORCID,van Rooij Sanne J.H.ORCID,Stein MurrayORCID,Bomyea Jessica,Koerte Inga K.ORCID,Choi KyleORCID,van der Werff Steven J.A.,Vermeiren Robert R.J.M.,Herzog Julia,Lebois Lauren A.M.ORCID,Baker Justin T.,Olson Elizabeth A.ORCID,Straube Thomas,Korgaonkar Mayuresh S.ORCID,Andrew Elpiniki,Zhu Ye,Li Gen,Ipser Jonathan,Hudson Anna R.ORCID,Peverill MatthewORCID,Sambrook Kelly,Gordon Evan,Baugh LeeORCID,Forster Gina,Simons Raluca M.,Simons Jeffrey S.,Magnotta VincentORCID,Maron-Katz Adi,du Plessis Stefan,Disner Seth G.ORCID,Davenport Nicholas,Grupe Daniel W.ORCID,Nitschke Jack B.,deRoon-Cassini Terri A.ORCID,Fitzgerald Jacklynn M.ORCID,Krystal John H.ORCID,Levy Ifat,Olff MirandaORCID,Veltman Dick J.,Wang Li,Neria Yuval,De Bellis Michael D.,Jovanovic TanjaORCID,Daniels Judith K.,Shenton Martha,van de Wee Nic J.A.,Schmahl Christian,Kaufman Milissa L.,Rosso Isabelle M.,Sponheim Scott R.ORCID,Hofmann David BerndORCID,Bryant Richard A.,Fercho Kelene A.,Stein Dan J.,Mueller Sven C.,Hosseini Bobak,Phan K. Luan,McLaughlin Katie A.,Davidson Richard J.,Larson Christine L.ORCID,May Geoffrey,Nelson Steven M.,Abdallah Chadi G.ORCID,Gomaa Hassaan,Etkin Amit,Seedat Soraya,Harpaz-Rotem Ilan,Liberzon IsraelORCID,van Erp Theo G.M.,Quidé Yann,Wang Xin,Thompson Paul M.,Morey Rajendra A.

Publisher

Elsevier BV

Subject

Cognitive Neuroscience,Neurology

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