On automating atomic force microscopes: An adaptive control approach-Reference-Cited by-同舟云学术

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On automating atomic force microscopes: An adaptive control approach

Published:2007-03 Issue:3 Volume:15 Page:349-361
ISSN:0967-0661
Container-title:Control Engineering Practice
language:en
Short-container-title:Control Engineering Practice

Author:

M. El Rifai Osamah,Youcef-Toumi Kamal

Publisher

Elsevier BV

Subject

Applied Mathematics,Electrical and Electronic Engineering,Computer Science Applications,Control and Systems Engineering

Reference19 articles.

1. Bhushan, B. (1996). Nanotribology and nanomechanics of MEMS devices. Proceedings of the ninth annual international workshop on micro-electro-mechanical systems (pp. 91–98).

2. Atomic force microscope;Binning;Physical Review Letters,1986

3. El-Rifai, O. M., & Youcef-Toumi, K. (2000). Dynamics of contact-mode atomic force microscopes. Proceedings of the American control conference (pp. 2118–2122). Chicago, Illinois, USA, June 28–30.

4. El-Rifai, O. M., & Youcef-Toumi, K. (2001). Coupling in piezoelectric tube scanners used in scanning probe microscopes. Proceedings of the American control conference (pp. 3251–3255). Arlington, Virginia, USA, June 25–27.

5. El-Rifai, O. M., & Youcef-Toumi, K. (2002). Dynamics of atomic force microscopes: Experiments and simulations. Proceedings of the IEEE conference on control applications (pp. 1126–1131). Glasgow, Scotland, September 18–20.

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3. AM-AFM System Analysis and Output Feedback Control Design With Sensor Saturation;IEEE Transactions on Nanotechnology;2013-03

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