1. Fix, E., and Hodges, J. L., Discriminatory Analysis, Nonparametric Discrimination, Consistency Properties (may be obtained via Defense Documentation Center for Scientific and Technical Information, Cameron Station, Alexandria, Virginia, U.S.A., Document No. ATI 110633).
2. An empirical Bayes approach to non-parametric two way classification;Johns,1961
3. Statistical methods for pattern classification;Kanal,1963
4. Learning Machines;Nilsson,1965
5. Decision Making Processes in Pattern Recognition;Sebestyen,1962