Ellipsometry and its application in the monitoring of surface cleanliness-Reference-Cited by-同舟云学术

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Ellipsometry and its application in the monitoring of surface cleanliness

Published:1984-09 Issue:1 Volume:23 Page:1-28
ISSN:0376-4583
Container-title:Surface Technology
language:en
Short-container-title:Surface Technology

Author:

Neal W.E.J.

Publisher

Elsevier BV

Subject

General Engineering

Reference55 articles.

1. Environment-sensitive mechanical behavior of oxides and oxide-coated metals

2. Deformation of Passive Films

3. The investigation of thin surface films on metals by means of reflected polarized light

4. Optical Studies of Metal Surfaces;Winterbottom,1955

Cited by 7 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Methods for Assessing Surface Cleanliness;Developments in Surface Contamination and Cleaning, Volume 12;2019

2. References;Developments in Surface Contamination and Cleaning, Volume 12;2019

3. Methods for Monitoring and Measuring Cleanliness of Surfaces;Developments in Surface Contamination and Cleaning;2012

4. LOCALIZED OPTICAL PHENOMENA AND THE CHARACTERIZATION OF MATERIALS INTERFACES;Annual Review of Materials Science;1997-08

5. Challenges in the structural characterization of thin organic films;Mikrochimica Acta;1991-01

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