Quantitative modelling in scanning probe microscopy-Reference-Cited by-同舟云学术

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Quantitative modelling in scanning probe microscopy

Published:2001-10 Issue:5 Volume:5 Page:427-434
ISSN:1359-0286
Container-title:Current Opinion in Solid State and Materials Science
language:en
Short-container-title:Current Opinion in Solid State and Materials Science

Author:

Foster A.S.,Hofer W.A.,Shluger A.L.

Publisher

Elsevier BV

Subject

General Materials Science

Reference54 articles.

1. Theory of the scanning tunneling microscope;Tersoff;Phys. Rev. B,1985

2. Tunneling spectroscopy of the Si(111)2×1 surface;Feenstra;Surf. Sci.,1987

3. Low temperature scanning force microscopy of the Si(111)–(7×7) surface;Lantz;Phys. Rev. Lett.,2000

4. Efficient method for the simulation of STM images. I. Generalized green-function formalism;Cerda;Phys. Rev. B,1997

5. Ness H, Fisher A. Influence of the tip-induced electric field on the STM contrast of chemisorbed C2H4 on the Si(001) surface; Nonperturbative evaluation of [STM] tunneling probabilities from ab initio calculations. Phys Rev B 1997;55/56:10081, 12469.

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