A drift detection method for industrial images based on a defect segmentation model
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Published:2024-10
Issue:
Volume:301
Page:112320
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ISSN:0950-7051
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Container-title:Knowledge-Based Systems
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language:en
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Short-container-title:Knowledge-Based Systems
Author:
Li Weifeng,
Li BinORCID,
Wang Zhenrong,
Qiu Chaochao,
Niu Shuanlong,
Tan Xin,
Niu TongzhiORCID