1. New method of recording electrons.;Carr;Rev. Sci. Instr.,1930
2. The point projection X-ray microscope as a point source for microbeam X-ray diffraction;Nixon,1957
3. X-ray microprojector;Rovinsky,1957
4. Powers, D.A. Von Hippel, A., Progress reports show consistent breakdown strengths between 50 and 200 megavolts per centimeter for film thicknesses between 700 and 4000 angstroms using alumino silicate glass. Massachusetts Inst. of Technol. Lab. for Insulation Research Cambridge, Massachusetts
5. Field emission;Good,1956