Variation of the yield of electron emission from a silicon single crystal with the diffraction condition of exciting x-rays
Author:
Publisher
Elsevier BV
Subject
General Physics and Astronomy
Reference7 articles.
1. Röntgenstrahl-Interferenzen;Laue,1960
2. Effect of Dynamical Diffraction in X-Ray Fluorescence Scattering
3. Intensity Anomaly of X-Ray Compton and Thermal Scatterings Accompanying the Bragg Reflections from Perfect Si and Ge Crystals
4. Intensity Anomaly of Fluorescent X-Ray Emission Accompanying the Laue Case Reflection from a Perfect Crystal
5. Direction Dependence of the Intensity Anomaly of the X-Ray Thermal Scattering Accompanying the Bragg Case Reflection
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2. Flux monitoring by x-ray diffracting crystals under ambient air conditions;SPIE Proceedings;2014-09-05
3. Synchrotron X-ray Diffraction Studies of Nanoscale Thin Films and Wires;Nihon Kessho Gakkaishi;2013
4. Dedication;Dynamical Theory of X-Ray Diffraction;2003-11-06
5. Useful formulae;Dynamical Theory of X-Ray Diffraction;2003-11-06
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