Thin-film UV–vis spectroscopy as a chemically-sensitive monitoring tool for copper etching bath
Author:
Funder
UNT
Publisher
Elsevier BV
Subject
General Chemical Engineering
Reference26 articles.
1. Practical Aspects for Subtractive Etching of High Density Interconnects;Ball,2017
2. Application of ferric chloride both as oxidant and complexant to enhance the dissolution of metallic copper
3. Printed circuit board industry
4. Copper etching with cupric chloride and regeneration of waste etchant
5. Analysis of key patents of the regeneration of acidic cupric chloride etchant waste and tin stripping waste
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