Structural stability, phase transition, and mechanical and electronic properties of transition metal nitrides MN (M=Tc, Re, Os, and Ir): First-principles calculations-Reference-Cited by-同舟云学术

Structural stability, phase transition, and mechanical and electronic properties of transition metal nitrides MN (M=Tc, Re, Os, and Ir): First-principles calculations

Published:2012-04 Issue: Volume:56 Page:116-121
ISSN:0927-0256
Container-title:Computational Materials Science
language:en
Short-container-title:Computational Materials Science

Author:

Wang Yachun,Yao Tiankai,Li Hui,Lian Jie,Li Jihui,Li Zhiping,Zhang Jingwu,Gou Huiyang

Publisher

Elsevier BV

Subject

Computational Mathematics,General Physics and Astronomy,Mechanics of Materials,General Materials Science,General Chemistry,General Computer Science

Reference45 articles.

1. Copper nitride and tin nitride thin films for write‐once optical recording media

2. Superconductivity at 25.5 K in electron-doped layered hafnium nitride

3. Ordering of Nitrogen in Nickel Nitride Ni3N Determined by Neutron Diffraction

4. High-Tc superconducting NbN films with low particulate density grown at 25 °C using pulsed laser deposition

5. New materials from high-pressure experiments

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