Electrical Breakdown Behaviors in Microgaps-Reference-Cited by-同舟云学术

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Electrical Breakdown Behaviors in Microgaps

Published:2019-10-02 Issue: Volume: Page:
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Container-title:Electrostatic Discharge - From Electrical breakdown in Micro-gaps to Nano-generators
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Author:

Meng Guodong,Cheng Yonghong

Publisher

IntechOpen

Link

http://www.intechopen.com/download/pdf/67663

Reference67 articles.

1. Brock DC, Moore GE. Understanding Moore’s Law: Four Decades of Innovation. San Francisco: Chemical Heritage Foundation; 2006. DOI: 10.5860/choice.44-6278

2. Rebeiz GM, Muldavin JB. RF MEMS switches and switch circuits. IEEE Microwave Magazine. 2001;2(4):59-71. DOI: 10.1109/6668.969936

3. Bilici MA, Haase JR, Boyle CR, Go DB, Sankaran RM. The smooth transition from field emission to a self-sustained plasma in microscale electrode gaps at atmospheric pressure. Journal of Applied Physics. 2016;119(22):223301. DOI: 10.1063/1.4953648

4. Steinman A. Reducing electrostatic related defects in photolithography. In: IEEE International Symposium on Semiconductor Manufacturing; 1994. DOI: 10.1109/ISSM.1994.729449

5. Montoya J, Levit L, Englisch A. A study of the mechanisms for ESD damage to reticles. IEEE Transactions on Electronics Packaging Manufacturing. 2001;24(2):78-85. DOI: 10.1109/6104.930957

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