Accuracy Investigation of De-Embedding Techniques Based on Electromagnetic Simulation for On-Wafer RF Measurements-Reference-Cited by-同舟云学术

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Accuracy Investigation of De-Embedding Techniques Based on Electromagnetic Simulation for On-Wafer RF Measurements

Published:2012-09-19 Issue: Volume: Page:
ISSN:
Container-title:Numerical Simulation - From Theory to Industry
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Author:

Hirano Takuichi,Okada Kenichi,Hirokawa Jiro,Ando Makoto

Publisher

InTech

Link

http://www.intechopen.com/download/pdf/39230

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