Abstract
[3,4-D,]Thiophen (1) has
been prepared by hydrogen-deuterium exchange reactions using
trifluoroacetic acid. [2,5-D2]Thiophen (2) and (1) show an
unexplained difference in the amount of scrambling in the formation of the CHS+
ion on electron impact. This difference is maintained when the electron beam
and ion draw-out voltages are varied.
Cited by
10 articles.
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