Size and Strain Parameters from Peak Profiles: Sense and Nonsense

Author:

Delhez R,de Keijser ThR,Mittemeijer EJ,Langford JI

Abstract

In principle the analysis of positions and shapes of diffraction peak profiles can reveal the imperfect crystalline structure of a sample. The parameters 'size' and 'strain' as obtained from the established Warren-Averbach method need to be used cautiously: in essence the order-independent and order-dependent parts of the line broadening are determined. These require interpretation in terms of structure parameters, for which additional information must often be available. In a case of pure size and strain broadening the order-independent part of the broadening can be interpreted straightforwardly in terms of a size distribution, whereas the order-dependent part cannot readily be related to a specific state of strain. Recent progress in this area is discussed. Non-ideal standard specimens introduce systematic errors. Within the framework of the Warren-Averbach and the single-line Voigt methods, it is shown that this non-ideal situation introduces a constant error and that relative determinations of size and strain are feasible.

Publisher

CSIRO Publishing

Subject

General Physics and Astronomy

同舟云学术

1.学者识别学者识别

2.学术分析学术分析

3.人才评估人才评估

"同舟云学术"是以全球学者为主线,采集、加工和组织学术论文而形成的新型学术文献查询和分析系统,可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容,当前同舟云学术共收录了国内外主流学术期刊6万余种,收集的期刊论文及会议论文总量共计约1.5亿篇,并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询!咨询电话:010-8811{复制后删除}0370

www.globalauthorid.com

TOP

Copyright © 2019-2024 北京同舟云网络信息技术有限公司
京公网安备11010802033243号  京ICP备18003416号-3