The effect of temperature stress on grain development in wheat

Author:

Asana RD,Williams RF

Abstract

Experiments were conducted in controlled environments to determine the effects of high temperatures on grain development and yield in wheat. Two Australian and three Indian cultivars of wheat were exposed, from a week after anthesis until maturity, to "day" temperatures of 25, 28, and 3l°C, and "night" temperatures of 9 and 12°C. There was a mean reduction in yield of 16%' for the 6° rise in day temperature, but the cultivars did not differ significantly in their response to these temperatures. There were no significant effects of night temperature on grain weight, but stem weight was less at 12°C. Senescence was hastened only slightly by high day temperature, and there were no differential effects between cultivars in this respect.In a subsidiary experiment one Indian and five Australian cultivars were subjected to three day-night temperature regimes (24/19°, 27/22°, and 30/25°C). Highly significant but complex interactions were established between temperature regime and cultivar. A growth analysis for the Australian cultivars Ridley and Diadem indicated that the developing grain of Ridley had a greater capacity for growth than that of Diadem from the earliest stage. This, together with the confirmation of grain size as a very stable characteristic for all the varieties, points to the developmental and synthetic activity of the grain as an important determinant of grain yield. The relevance of this study to the production of wheat in India is briefly discussed.

Publisher

CSIRO Publishing

Subject

General Agricultural and Biological Sciences

同舟云学术

1.学者识别学者识别

2.学术分析学术分析

3.人才评估人才评估

"同舟云学术"是以全球学者为主线,采集、加工和组织学术论文而形成的新型学术文献查询和分析系统,可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容,当前同舟云学术共收录了国内外主流学术期刊6万余种,收集的期刊论文及会议论文总量共计约1.5亿篇,并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询!咨询电话:010-8811{复制后删除}0370

www.globalauthorid.com

TOP

Copyright © 2019-2024 北京同舟云网络信息技术有限公司
京公网安备11010802033243号  京ICP备18003416号-3