Author:
White John W.,Garrett Richard F.,Brown Anthony S.,King David J.,Dowling Trevor L.
Abstract
Many important processes occur at surfaces and interfaces on timescales
ranging from milliseconds up to hours. The advent of third generation
synchrotrons provides X-ray fluxes sufficiently high that it is now
conceivable that these processes can be studied with millisecond time
resolution using X-ray reflectometry. Several configurations for an X-ray
reflectometer designed to measure X-ray reflectivity profiles with this time
resolution are examined. The feasibility of each configuration in terms of
information retrieval from reflectivity data is explored by application of
modelling techniques to simulated ‘experimental’ data.
Subject
General Physics and Astronomy
Cited by
7 articles.
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