The Study of the Electrical Properties of Anisotropic Semiconductors in the Laboratory Workshop of the University Course in Physics

Author:

Filippov V. V.1ORCID,Zavorotny A. A.2ORCID,Smirnov M. Yu.3ORCID,Ziyautdinov V. S.3ORCID,Lykov D. D.4ORCID

Affiliation:

1. Lipetsk State Pedagogical University named after P. P. Semenov-Tyan-Shansky; Moscow State University of Technology and Management named after K.G. Razumovsky (PKU), Lipetsk Cossack Institute of Technology and Management (branch)

2. Lipetsk State Technical University

3. Moscow State University of Technology and Management named after K.G. Razumovsky (PKU), Lipetsk Cossack Institute of Technology and Management (branch)

4. Lipetsk State Pedagogical University named after P. P. Semenov-Tyan-Shansky

Abstract

The purpose of the article is to develop a theoretically and experimentally substantiated specific laboratory work for studying the anisotropy of the electrical properties of semiconductors within the framework of the curricula of higher educational institutions, for such areas of training as “Physics”, “Technical Physics”, “Radiophysics” and “Electronics and Nanoelectronics”. The relevance of the problem is due to the desire of domestic electronics for technological sovereignty and high requirements for the training of qualified personnel for the production of structures of solid-state functional electronics. Based on the solution of the boundary electrodynamic problem, an expression is obtained for the electric potential in the region of a thin rectangular semiconductor sample with a tensor character of conductivity. The results of this work is the development of an original laboratory setup for the demonstration and practical study of the anisotropy of the electrical properties of semiconductor crystals. The proposed technique makes it possible to determine the main electrokinetic parameters of an anisotropic semiconductor – specific conductivity, concentration and Hall mobility of the main charge carriers. A schematic diagram of the installation and formulas for calculating the errors of the measured quantities are proposed. The results obtained may also be of scientific interest in the study of anisotropic semiconductor materials in laboratory conditions.

Publisher

Novosibirsk State University (NSU)

Subject

Automotive Engineering

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